STADIVARI

Description

STADIVARI X-Ray Diffraction System

The STADIVARI by STOE is a highly flexible X-ray diffraction platform designed to support both single crystal and powder diffraction applications. Built for versatility and precision, it adapts seamlessly to a wide range of experimental conditions and advanced research needs.

Key Features

• Flexible goniometer with Eulerian cradle and fixed chi configurations
• Exceptional precision with sphere of confusion < 0.005 mm
• Supports multiple X-ray source options (sealed tubes, microfocus, MetalJet, synchrotron)
• Ultrafast hybrid pixel detectors (EIGER and PILATUS series)
• Compatible with various non-ambient accessories (temperature, pressure, etc.)

Core Advantages

• Dual-beam configuration allows multiple source combinations
• Suitable for both vertical and horizontal setups
• High stability and accuracy even with heavy accessories
• Wide angular coverage for comprehensive data acquisition
• Seamless integration with advanced X-AREA software

System Capabilities

• Designed for complex experimental setups including high-pressure and temperature studies
• Open Eulerian cradle provides maximum accessibility to the sample environment
• Automatic detector distance adjustment (40 – 140 mm)
• Supports cutting-edge detector technology for high-speed, high-resolution measurements

Specifications (Summary)

• Sphere of confusion: < 0.005 mm radius
• Angular ranges: 2θ: 240°, ω: 205°, χ: 90°, φ: 360°
• Detector distance: 40 – 140 mm (automatic)
• X-ray sources: Ag, Mo, Cu (sealed & microfocus), MetalJet, synchrotron
• Dimensions: 1680 × 1150 × 1900 mm
• Weight: ~760 kg

Detector Highlights (EIGER2 1M CdTe)

• Hybrid pixel counting technology
• Pixel size: 75 × 75 µm
• Dynamic range: 32-bit
• Maximum count rate: 9.8 × 10⁸ photons/s/mm²
• Energy range: 8 – 25 keV
• Frame rate: up to 100 Hz with continuous readout

Applications

• Single crystal structure analysis
• Powder diffraction
• High-pressure and temperature studies
• Synchrotron-based experiments
• Advanced material characterization