STADI MP

Description

STADI MP X-Ray Diffraction System

The STADI MP by STOE is a versatile X-ray diffraction system that integrates multiple measurement geometries into a single platform. Designed for flexibility and precision, it enables seamless switching between configurations without the need for realignment.

Key Features

• Multiple single-photon-counting X-ray detectors (MYTHEN series)
• Supports high and low temperature attachments
• Combines Transmission/Debye-Scherrer, Bragg-Brentano, and micro-diffraction modes
• Geometry selection via sliding tube housing
• Pure Kα1 radiation (Co, Cu, Mo, Ag) across all configurations

Core Advantages

• One goniometer supporting three geometries:
  • Transmission (Debye-Scherrer)
  • High Flux / Micro-diffraction
  • Bragg-Brentano
• No need to exchange optics or perform realignment between modes
• Consistent high-quality data across all measurement setups
• Ideal for both routine analysis and advanced research applications

Transmission Geometry Benefits

• Constant sample volume across the full 2θ range
• Reliable intensity without additional corrections
• No line broadening for weak absorbers
• No height displacement errors
• Enables true micro-sampling
• Reduced preferred orientation effects

Specifications (Summary)

• 2θ range: -10° to 140° (depending on geometry)
• Goniometer: 2-circle system
• Measuring radius: 140 – 573 mm (depending on setup)
• Focusing radius: 160 mm
• X-ray sources: Co, Cu, Mo, Ag (sealed tubes)
• Detectors: MYTHEN2 R (1K / 2K / 3K / 4K)
• Software: WinXPOW
• Dimensions: 1800 × 880 × 2050 mm
• Weight: ~870 kg

Software & Accessories

Powered by WinXPOW, offering:

• Instrument control and automation
• Data reduction and analysis (profile fitting, indexing, space group determination)
• Advanced 2D and 3D visualization tools

Available accessories include:

• High- and low-temperature attachments
• Reaction chambers for reflection samples
• Various sample stages and changers
• Specialized holders for precise alignment

Applications

• Powder diffraction analysis
• Micro-diffraction studies
• High-temperature and in-situ experiments
• Air- and moisture-sensitive sample analysis
• Advanced materials characterization